• P80000
    P80000-PCIeSFF8639-Single/Dual
    (NVMe)
    80 PORT TEST SYSTEM FOR SFF8639 NVME SOLID STATE DRIVES.
    THIS TEST SYSTEM SUPPORTS PCIE GEN3.0x4 LANE
    (BACKWARD COMPATIBLE WITH GEN 1 AND GEN2).
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  • BI-003
    ASI-BI003-00A
    3 PORT UART TEST SYSTEM FOR SFF8639 NVME SOLID STATE DRIVES.
    CUSTOMIZED UART CONNECTIVITY.
    OPTIONAL ADAPTERS (SOLD SEPARATELY) CAN BE USED TO TEST PCIE CARDS AND M.2 FORM FACTORS.
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  • BI-003
    P40000 – PCIe/NVMe Test Chamber
    40 PORT PCIe TEST SYSTEM
    PCIe GEN 3 x4 LANE, M.2, U.2, PCIe EDGE CARD
    WEB BASED GUI CONTROL SW, NVMe COMPLIANCE TEST
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  • Flash Memory Summit
    Flash Memory Summit 2016
    August 9-11, 2016
    Santa Clara Convention Center
    Booth #840
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Full range of PCIe/NVME test solutions for Solid State Drives(SSD)

Based on proven PCIe/NVME protocol, we offer test systems that can be used in R&D, QA, Firmware validation, and production.

Extensive industry experience, knowledge, and capabilities

ASI BI-120A

Test Systems

We offer test systems that can be used in R&D, QA, Firmware validation, and production.

ASI P8000

Custom Test Solutions

We can tailor custom test solutions for customers’ needs and requirements.